Suzhou Electric Appliance Research Institute
期刊號(hào): CN32-1800/TM| ISSN1007-3175

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電容器連接件過熱試驗(yàn)研究

來源:電工電氣發(fā)布時(shí)間:2016-06-25 15:25 瀏覽次數(shù):6
電容器連接件過熱試驗(yàn)研究
 
劉強(qiáng),梁清雲(yún)
(三峽大學(xué) 電氣與新能源學(xué)院,湖北 宜昌 443002)
 
    摘 要:為探索電容器存在連接組件過熱的根本原因,通過建立接觸不良物理模型,分別從接觸電阻變化和放電兩方面進(jìn)行試驗(yàn)研究,并且比較了不同類型負(fù)載的影響。研究結(jié)果表明:接觸電阻隨接觸間隙的增大先線性增加,后呈指數(shù)形式增加;在同等條件下,容性電路的放電次數(shù)更多,接觸放電所產(chǎn)生的溫升較正常接觸高得多。
    關(guān)鍵詞:電容器;過熱;接觸電阻;放電;試驗(yàn)
    中圖分類號(hào):TM53       文獻(xiàn)標(biāo)識(shí)碼:A       文章編號(hào):1007-3175(2016)06-0044-03
 
Experimental Study of Overheating on Capacitor Fittings
 
LIU Qiang, LIANG Qing-yun
(College of Electrical Engineering and New Energy, China Three Gorges University, Yichang 443002, China)
 
    Abstract: In order to explore the primary cause of overheating for capacitor fittings, this paper established a bad contact physical model to carry out experimental study from the change and discharge of contact resistance and compared the influence of different load types. The researched results show that the contact resistance has a right ascension first and then index increase with the increase of contact gap. On an equal footing, the capacitive circuit has more discharge times, and the temperature rise of contact discharge is much more than normal contact.
    Key words: capacitor; overheating; contact resistance; discharge; text
 
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